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Defect inspection in semiconductor images using FAST-MCD method and neural network Yu, Jinkyu; Han, Songhee; Lee, Chang-Ock, INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, v.129, no.3-4, pp.1547 - 1565, 2023-11 |
Dying ReLU and Initialization: Theory and Numerical Examples Lu, Lu; Shin, Yeonjong; Su, Yanhui; Karniadakis, George Em, COMMUNICATIONS IN COMPUTATIONAL PHYSICS, v.28, no.5, pp.1671 - 1706, 2020-11 |
Individual tooth segmentation in human teeth images using pseudo edge-region obtained by deep neural networks Kim, Seongeun; Lee, Chang-Ock, SIGNAL PROCESSING-IMAGE COMMUNICATION, v.120, 2024-01 |
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