Browse "MA-Journal Papers(저널논문)" by Subject Defect inspection
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| Defect inspection in semiconductor images using FAST-MCD method and neural network Yu, Jinkyu; Han, Songhee; Lee, Chang-Ock, INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, v.129, no.3-4, pp.1547 - 1565, 2023-11 |
| DEFECT INSPECTION IN SEMICONDUCTOR IMAGES USING HISTOGRAM FITTING AND NEURAL NETWORKS 유진규; 한송희; 이창옥, JOURNAL OF THE KOREAN SOCIETY FOR INDUSTRIAL AND APPLIED MATHEMATICS, v.26, no.4, pp.263 - 279, 2022-12 |
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