Browse "AE-Journal Papers(저널논문)" by Author Ahmed, Hassan
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| Development of Dual Port Scanning Free Space Measurement System Hyun, Jongmin; Ahmed, Hassan; Lee, Jung-Ryul, MEASUREMENT SCIENCE & TECHNOLOGY, v.29, no.7, 2018-05 |
| Development of scanning single port free space measurement setup for imaging reflection loss of microwave absorbing materials Ahmed, Hassan; Hyun, Jongmin; Lee, Jung-Ryul, MEASUREMENT, v.125, pp.114 - 122, 2018-09 |
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