DC Field | Value | Language |
---|---|---|
dc.contributor.author | Bai, Do Sun | ko |
dc.contributor.author | j.s. jang | ko |
dc.contributor.author | y.i. kwon | ko |
dc.date.accessioned | 2013-02-25T09:22:57Z | - |
dc.date.available | 2013-02-25T09:22:57Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1983 | - |
dc.identifier.citation | IEEE TRANSACTIONS ON RELIABILITY, v.32, no.5, pp.512 - 514 | - |
dc.identifier.issn | 0018-9529 | - |
dc.identifier.uri | http://hdl.handle.net/10203/61148 | - |
dc.language | English | - |
dc.publisher | IEEE-Inst Electrical Electronics Engineers Inc | - |
dc.title | Generalized Preventive Maintenance Policies for a System Subject to Deterioration | - |
dc.type | Article | - |
dc.identifier.wosid | A1983TK78400028 | - |
dc.identifier.scopusid | 2-s2.0-0021007525 | - |
dc.type.rims | ART | - |
dc.citation.volume | 32 | - |
dc.citation.issue | 5 | - |
dc.citation.beginningpage | 512 | - |
dc.citation.endingpage | 514 | - |
dc.citation.publicationname | IEEE TRANSACTIONS ON RELIABILITY | - |
dc.contributor.nonIdAuthor | j.s. jang | - |
dc.contributor.nonIdAuthor | y.i. kwon | - |
dc.type.journalArticle | Article | - |
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