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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Effect of a rapid thermal annealing process on the electrical properties of an aluminum-doped indium zinc tin oxide thin film transistor Nam, Yunyong; Yang, Jong-Heon; Jeong, Pilseong; Kwon, Oh-Sang; Pi, Jae-Eun; Cho, Sung Haeng; Hwang, Chi-Sun; Ahn, Jeahan; Ji, Sanghyun; Park, Sang-Hee Ko, PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, v.214, no.1, 2017-01 |
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