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NO	Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1	Atomic-resolution imaging of the nanoscale origin of toughness in rare-earth doped SiC Kueck, AM; Kim, Do Kyung; Ramasse, QM; De Jonghe, LC; Ritchie, RO, NANO LETTERS, v.8, pp.2935 - 2939, 2008-09
2	Contact damage and strength degradation in brittle/quasi-plastic silicon nitride bilayers Lee, KS; Lee, SK; Lawn, BR; Kim, Do Kyung, JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.81, no.9, pp.2394 - 2404, 1998-09
3	Effect of starting powder on damage resistance of silicon nitrides Lee, SK; Lee, KS; Lawn, BR; Kim, Do Kyung, JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.81, no.8, pp.2061 - 2070, 1998-08

Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)

Kueck, AM; Kim, Do Kyung; Ramasse, QM; De Jonghe, LC; Ritchie, RO, NANO LETTERS, v.8, pp.2935 - 2939, 2008-09

Lee, KS; Lee, SK; Lawn, BR; Kim, Do Kyung, JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.81, no.9, pp.2394 - 2404, 1998-09

Lee, SK; Lee, KS; Lawn, BR; Kim, Do Kyung, JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.81, no.8, pp.2061 - 2070, 1998-08

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