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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Atomic-resolution imaging of the nanoscale origin of toughness in rare-earth doped SiC Kueck, AM; Kim, Do Kyung; Ramasse, QM; De Jonghe, LC; Ritchie, RO, NANO LETTERS, v.8, pp.2935 - 2939, 2008-09 |