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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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In situ observation of fracture sequence of physical vapor deposited TiN film on (11(2)over-bar-0) sapphire Kim, YG; Kim, Do Kyung, JOURNAL OF MATERIALS RESEARCH, v.20, no.6, pp.1389 - 1395, 2005-06 | |
Effect of grain boundary phase on contact damage resistance of silicon nitride ceramics Lee, CS; Lee, KS; Lee, SW; Kim, Do Kyung, ADVANCED SI-BASED CERAMICS AND COMPOSITES BOOK SERIES: KEY ENGINEERING MATERIALS, v.287, pp.421 - 426, 2005 |
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