Browse "MS-Journal Papers(저널논문)" by Subject a-InGaZnO
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| Comparative Study on Light-Induced Bias Stress Instability of IGZO Transistors With SiNx and SiO2 Gate Dielectrics Ji, Kwang Hwan; Kim, Ji-In; Mo, Yeon-Gon; Jeong, Jong Han; Yang, Shinhyuk; Hwang, Chi-Sun; Park, Sang-Hee Ko; et al, IEEE ELECTRON DEVICE LETTERS, v.31, no.12, pp.1404 - 1406, 2010-12 |
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