Browse "MS-Journal Papers(저널논문)" by Subject KPFM
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| Channel Thickness-Dependent Degradation of Field-Effect Mobility in Multilayer MoS2 Transistors Jeon, Dae-Young; Joo, Soyun; Lee, Dahyun; HONG, DANIEL SEUNGBUM, ACS Applied Electronic Materials, v.6, no.1, pp.465 - 471, 2023-12 |
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