Browse "MS-Journal Papers(저널논문)" by Subject III-V
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| A Distributed Model for Border Traps in Al2O3 - InGaAs MOS Devices Yuan, Yu; Wang, Lingquan; Yu, Bo; Shin, Byungha; Ahn, Jaesoo; McIntyre, Paul C.; Asbeck, Peter M.; et al, IEEE ELECTRON DEVICE LETTERS, v.32, no.4, pp.485 - 487, 2011-04 |
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