Browse "MS-Journal Papers(저널논문)" by Subject FAILURE-MECHANISM
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Atomic diffusion induced degradation in bimetallic layer coated cemented tungsten carbide Peng, Zirong; Rohwerder, Michael; Choi, Pyuck-Pa; Gault, Baptiste; Meiners, Thorsten; Friedrichs, Marcel; Kreilkamp, Holger; et al, CORROSION SCIENCE, v.120, pp.1 - 13, 2017-05 |
| Plasma-enhanced atomic layer deposition of Ru-TiN thin films for copper diffusion barrier metals Kwon, SH; Kwon, OK; Min, JS; Kang, SW, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.153, no.6, pp.G578 - G581, 2006 |
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