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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Effect of bit size dependence on the grain size in ferroelectric thin films using piezoelectric force microscopy No, Kwangsoo; Kim, Yun Seok; Hong, Seung Bum; Park, Hong Sik; Min, Dong Ki, Seeing at the Nanoscale conference II, v.0, no.0, pp.0 - 0, 2004-10-14 |
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