2141 | Electrical manipulation of exchange bias in IrMn/NiFe bilayer structures Kang, Jaimin; Ryu, Jeongchun; Choi, Jong-Guk; Lee, Taek-hyeon; Park, Jaehyeon; Lee, Soogil; JANG, HANHWI; et al, 12th International Conference on Advanced Materials and Devices, ICAMD 2021, The Korean Physical Society, 2021-12-08 |
2142 | Electrical manipulation of exchange bias in IrMn/NiFe heterostructures 강재민; 류정춘; 최종국; 이택현; 박재현; 이수길; 김갑진; et al, 2021 한국자기학회 하계학술대회, 한국자기학회, 2021-07-21 |
2143 | Electrical Properties and Crystal Structure of the BST thin Film Prepared on Platinized Silicon by RF Magnetron Sputtering Kim, Ho Gi, Proceeding of the 11th Korea-Japan Seminar on New Ceramics, 1994, pp.261 - 265, 1994-01-01 |
2144 | Electrical properties of (Ba,Sr)TiO2 with Iridium Electrode Kim, Ho Gi, IUMRS-ICEM, 1998, pp.130 - 130, 1998-01-01 |
2145 | Electrical Properties of Aluminium Barrier-Type Oxide Films 변수일, Korean Corros. Sci. Soc., pp.60 - 61, 1990 |
2146 | Electrical Properties of Barium Strontium Titanates(Bao.5Sro.5) Tio3 Thin films Deposited on Various Pt-Base Electrodes Kim, Ho Gi, international symposium on integrated ferroelectrics, 1995, 1995-01-01 |
2147 | Electrical Properties of Bismuth-Ruthenate Based Thick Film Resistors 김호기, The Korean Ceramic Soc., Fall meeting, Myongji Univ., 1989 |
2148 | Electrical Properties of CIS Films Prepared by Evaporation of Cu2Se and In2Se3 Ahn, Byung Tae, 9th Photovoltaic Science and Engineering Conference (PVSEC-9), pp.395 - 396, 1996 |
2149 | Electrical Properties of Lead Zirconyltitanate thin Films Deposited on Lanthanum Nickel Cobaltate Kim, Ho Gi, IUMRS-ICEM, pp.132 - 132, 1998-01-01 |
2150 | Electrical Properties of Nickel Oxide Thin Films with Molybdenum Oxide Nanoparticles Blended Structure 김무현; 정연식, 2019 한국세라믹학회 추계학술대회, 한국세라믹학회, 2019-11-14 |
2151 | Electrical Properties of NTC Thermistor in MgO Doped Cr2O3 김호기, The Korean Ceramic Society,fall meeting, Kyeung-nam Univ., 1986 |
2152 | Electrical Properties of PbTiO3 Thin Films Fabricated by CVD 김호기, The Korean Inst. Elect. Eng., KERI, 1989 |
2153 | Electrical Properties of PZT Thin Films Deposited by ECR MOCVD No, Kwangsoo; Kim, ST; Kim, JW; Chung, Sw; Shin, JS; Ahn, ST; Lee, WJ, 1994 International Conference on Electronic Materials (ICEM '94), 1994-01-01 |
2154 | Electrical properties of PZT thin films deposited on Lanthanum Strontium Cobaltate electrode by D.C. Reactive Sputtering Kim, Ho Gi, pp.132 - 132, 1998-01-01 |
2155 | Electrical properties of Sb-doped PZT thin films by reactive sputtering Ho-Gi Kim, 한국요업학회 춘계학술발표, 1997-01-01 |
2156 | Electrical Properties of Ultra Thin BST Films Fabricated using ECR-PECVD No, Kwangsoo, ISIF, ISIF, 1998-01-01 |
2157 | Electrical proporties of PZTthin films deposited on conducting oxide electrodes (LSCO,LNCO) by D. C. reactive sputtering Kim, Ho Gi, PacRim3, pp.201 - 202, 1998-01-01 |
2158 | Electrical Stress Distribution in BaTiO3 Ceramics Kim, Ho Gi, 5th int. Symp. on High Voltage Engineering (West Germany), 1987 |
2159 | Electrically Induced Microcracking in Piezoelecric Ceramics 김호기, The Korea Ceramic Society, fall meeting, Seoul Univ., 1988 |
2160 | Electro-codeposition of Pd nanoparticles for mapping the three-dimensional atomic distribution by atom probe tomography 김세호; 최벽파, 2018 한국화학공학회 춘계학술대회, 한국화학공학회, 2018-04-26 |