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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Variational Deep Clustering of Wafer Map Patterns Hwang, Jonghyun; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.3, pp.466 - 475, 2020-08 | |
Bayesian variable selection in clustering high-dimensional data via a mixture of finite mixtures Doo, Woojin; Kim, Heeyoung, JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION, v.91, no.12, pp.2551 - 2568, 2021-08 |
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