Results 11-20 of 29 (Search time: 0.012 seconds).
NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Colored ACD and its application Kim, Hyeonsik; Choi, Byoung-Kyu, SIMULATION MODELLING PRACTICE AND THEORY, v.63, pp.133 - 148, 2016-04 | |
Strategic airline operation considering the carbon constrained air transport industry Ko, Young Dae; Jang, Young Jae; Kim, Dae Young, JOURNAL OF AIR TRANSPORT MANAGEMENT, v.62, pp.1 - 9, 2017-07 | |
Estimating parameters of the power law process with two measures of failure time Ahn, Chang-Won; Chae, Kyung-Chul; Clark, Gordon M., JOURNAL OF QUALITY TECHNOLOGY, v.30, no.2, pp.127 - 132, 1998-04 | |
Periodic Wear-Limit Replacement with Wear-Dependent Failures Park, Kyung Soo, MICROELECTRONICS RELIABILITY, v.37, no.3, pp.467 - 472, 1996-01 | |
The effects of presenting functionally abstracted information in fault diagnosis tasks Ham, DH; Yoon, Wan Chul, RELIABILITY ENGINEERING SYSTEM SAFETY, v.73, no.2, pp.103 - 119, 2001-08 | |
An integrated approach to dynamic plant location and capacity planning Lim, SK; Kim, Yeong-Dae, JOURNAL OF THE OPERATIONAL RESEARCH SOCIETY, v.50, no.12, pp.1205 - 1216, 1999-12 | |
An invariance in the priority queue with generalized server vacations and structured batch arrivals Yoon, BK; Chae, Kyung-Chul, STOCHASTIC ANALYSIS AND APPLICATIONS, v.21, pp.917 - 933, 2003-07 | |
Planning performance degradation tests - A review Yum, Bong-Jin; Lim, H; Seo, SK, INTERNATIONAL JOURNAL OF INDUSTRIAL ENGINEERING-THEORY APPLICATIONS AND PRACTICE, v.14, pp.372 - 381, 2007-12 | |
Due-date based scheduling and control policies in a multiproduct semiconductor wafer fabrication facility Kim, Yeong-Dae; Kim, JU; Lim, SK; Jun, HB, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.11, no.1, pp.155 - 164, 1998-02 | |
Automata-based supervisory control logic design for a multi-robot assembly cell Lee, JK; Lee, Tae-Eog, INTERNATIONAL JOURNAL OF COMPUTER INTEGRATED MANUFACTURING, v.15, no.4, pp.319 - 334, 2002 |
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