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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
Too Much Information: Assessing Privacy Risks of Contact Trace Data Disclosure on People With COVID-19 in South Korea Jung, Gyuwon; Lee, Hyunsoo; Kim, Auk; Lee, Uichin, FRONTIERS IN PUBLIC HEALTH, v.8, no.305, pp.1 - 13, 2020-06 | |
| Algorithms for a two-machine flowshop problem with jobs of two classes Jeong, BongJoo; Kim, Yeong-Dae; Shim, Sang-Oh, INTERNATIONAL TRANSACTIONS IN OPERATIONAL RESEARCH, v.27, no.6, pp.3123 - 3143, 2020-11 | |
| Development and validation of a wearable inertial sensors-based automated system for assessing work-related musculoskeletal disorders in the workspace Huang, Chunxi; Kim, Woojoo; Zhang, Yanxin; Xiong, Shuping, INTERNATIONAL JOURNAL OF ENVIRONMENTAL RESEARCH AND PUBLIC HEALTH, v.17, no.17, pp.6050, 2020-09 | |
| Achieving Portfolio Diversification for Individuals with Low Financial Sustainability Lee, Yongjae; Kim, Woo Chang; Kim, Jang Ho, SUSTAINABILITY, v.12, no.17, 2020-09 | |
| Analysis of Backward Sequence for Single-Armed Cluster Tools With Processing Time Variations Lee, Jun-Ho; Kim, Jun-Ho, IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, v.17, no.4, pp.2167 - 2174, 2020-10 | |
| Item Assignment Problem in a Robotic Mobile Fulfillment System Kim, Hyun-Jung; Pais, Cristobal; Shen, Zuo-Jun Max, IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, v.17, no.4, pp.1854 - 1867, 2020-10 | |
| A Sequential Search Method of Dispatching Rules for Scheduling of LCD Manufacturing Systems Lee, Je-Hun; Kim, Young; Kim, Yun Bae; Kim, Byung-Hee; Jung, Gu-Hwan; Kim, Hyun-Jung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.496 - 503, 2020-11 | |
| Development of a Framework to Understand Tables in Engineering Specification Documents Agossou, Valentin; Suh, Hyo-Won; Lee, Heejung; Lee, Jae Hyun, APPLIED SCIENCES-BASEL, v.10, no.18, 2020-09 | |
| Multiresolution spatial generalized linear mixed model for integrating multi-fidelity spatial count data without common identifiers between data sources Kim, Sungil; Duan, Rong; Ma, Guang-Qin; Kim, Heeyoung, SPATIAL STATISTICS, v.39, 2020-10 | |
| Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps With Mixed-Type Defect Patterns Lee, Hyuck; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.653 - 662, 2020-11 |
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