Results 1-7 of 7 (Search time: 0.003 seconds).
NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Contextual anomaly detection for high-dimensional data using Dirichlet process variational autoencoder Kim, Hyojoong; Kim, Heeyoung, IISE TRANSACTIONS, v.55, no.5, pp.433 - 444, 2023-01 | |
Deep embedding kernel mixture networks for conditional anomaly detection in high-dimensional data Kim, Hyojoong; Kim, Heeyoung, INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, v.61, no.4, pp.1101 - 1113, 2023-03 | |
Label-Noise Robust Deep Generative Model for Semi-Supervised Learning Yoon, Heegeon; Kim, Heeyoung, TECHNOMETRICS, v.65, no.1, pp.83 - 95, 2023-01 | |
Semi-Supervised Learning for Simultaneous Location Detection and Classification of Mixed-Type Defect Patterns in Wafer Bin Maps Lee, Hyuck; Lee, Jaehyun; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.2, pp.220 - 230, 2023-05 | |
Contextual anomaly detection for multivariate time series data Kim, Hyojoong; Kim, Heeyoung, QUALITY ENGINEERING, v.35, no.4, pp.686 - 695, 2023-10 | |
Toward Data-Driven Digital Therapeutics Analytics: Literature Review and Research Directions Lee, Uichin; Jung, Gyuwon; Ma, Eun-Yeol; Kim, Jin San; Kim, Heepyung; Alikhanov, Jumabek; Noh, Youngtae; Kim, Heeyoung, IEEE-CAA JOURNAL OF AUTOMATICA SINICA, v.10, no.1, pp.42 - 66, 2023-01 | |
Prediction of Highly Imbalanced Semiconductor Chip-Level Defects in Module Tests Using Multimodal Fusion and Logit Adjustment Cho, Hunsung; Koo, Wonmo; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.3, pp.425 - 433, 2023-08 |
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