Browse "IE-Journal Papers(저널논문)" by Subject Convolutional neural networks
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| Memory-Augmented Convolutional Neural Networks With Triplet Loss for Imbalanced Wafer Defect Pattern Classification Hyun, Yunseung; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.622 - 634, 2020-11 |
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