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Fluctuation smoothing production control at IBM’s 200mm wafer fabricator: Extensions, application and the multi-flow production index (MFPx) Morrison, James R; Dews, Elizabeth; LaFreniere, John, Proceedings of the 2006 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, IEEE, 2006-05 |
Implementation of a Fluctuation Smoothing Production Control Policy in IBM’s 200mm Wafer Fab Morrison, James R; Campbell, Brian; Dews, Elizabeth; LaFreniere, John, IEEE Conference on Decision and Control and the European Control Conference, IEEE, 2005-12-12 |
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