Indium content measurement and influence on etch pit density of VPE grown InxGa1-xAs(x<0.03)/GaAs epilayers
- Publisher
- Elsevier Science Bv
- Issue Date
- 1988-10
- Language
- English
- Article Type
- Article
- Citation
JOURNAL OF CRYSTAL GROWTH, v.92, no.1-2, pp.77 - 82
- ISSN
- 0022-0248
- Appears in Collection
- Files in This Item
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