DC Field | Value | Language |
---|---|---|
dc.contributor.author | KOO, JY | ko |
dc.contributor.author | Park, Kyu Ho | ko |
dc.contributor.author | KIM, M | ko |
dc.date.accessioned | 2013-02-25T07:58:53Z | - |
dc.date.available | 2013-02-25T07:58:53Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1985-12 | - |
dc.identifier.citation | PATTERN RECOGNITION LETTERS, v.3, no.6, pp.399 - 402 | - |
dc.identifier.issn | 0167-8655 | - |
dc.identifier.uri | http://hdl.handle.net/10203/60668 | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.title | IMPROVING THE LABELING ACCURACY BY A NEW PROBABILISTIC RELAXATION LABELING | - |
dc.type | Article | - |
dc.identifier.wosid | A1985AYN5400005 | - |
dc.identifier.scopusid | 2-s2.0-0022248994 | - |
dc.type.rims | ART | - |
dc.citation.volume | 3 | - |
dc.citation.issue | 6 | - |
dc.citation.beginningpage | 399 | - |
dc.citation.endingpage | 402 | - |
dc.citation.publicationname | PATTERN RECOGNITION LETTERS | - |
dc.contributor.localauthor | Park, Kyu Ho | - |
dc.contributor.nonIdAuthor | KOO, JY | - |
dc.contributor.nonIdAuthor | KIM, M | - |
dc.type.journalArticle | Article | - |
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