Search

Start a new search
Current filters:
Add filters:
  • Results/Page
  • Sort items by
  • In order
  • Authors/record

Results 1-1 of 1 (Search time: 0.002 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
Coating thickness estimation in silicon wafer using ultrafast ultrasonic measurement

Liu, Peipei; Yi, Kiyoon; Sohn, Hoon, Health Monitoring of Structural and Biological Systems IX 2020, SPIE, 2020-04-22

Discover

Type

Author

rss_1.0 rss_2.0 atom_1.0