Browse "CBE-Journal Papers(저널논문)" by Subject VOID DEFECTS
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| Modeling of Defects Generation in 300 mm Silicon Monocrystals during Czochralski Growth Lee, Sang Hun; Song, Do Won; Oh, Hyun Jung; Kim, DoHyun, JAPANESE JOURNAL OF APPLIED PHYSICS, v.49, no.12, pp.1 - 6, 2010-12 |
| Multi Scale Modeling and Simulation for Oxygen Precipitate Behavior in Silicon Wafer Lee, Sang Hun; Kang, Jeong Won; Kim, DoHyun, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.11, no.7, pp.5980 - 5984, 2011-07 |
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