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Showing results 1 to 12 of 12

1
Cation disorder study of Bb(3.25)La(0.75)Ti(3)O(12) by neutron powder diffraction and Raman spectroscopy

Jeon, MK; Kim, Y; Sohn, JM; Woo, Seong-Ihl, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.37, no.18, pp.2588 - 2592, 2004-09

2
Combinatorial approach for ferroelectric material libraries prepared by liquid source misted chemical deposition method

Kim, Ki Woong; Jeon, Min Ku; Oh, Kwang Seok; Kim, Tai Suk; Kim, Yun Seok; Woo, Seong-Ihl, PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, v.104, no.4, pp.1134 - 1139, 2007-01

3
Combined structural refinement and spontaneous polarization study of Bi(3.5)Ce(0.5)Ti(3)O(12) by using x-ray and neutron powder diffraction data

Jeon, Min Ku; Kim, Yong-Il; Nahm, Seung-Hoon; Jung, Chang Hwa; Woo, Seong-Ihl, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.41, no.8, 2008-04

4
Combined structural refinement of Bi3.5La0.5Ti3O12 using neutron and X-ray powder diffraction data

Jeon, MK; Kim, YI; Nahm, SH; Woo, Seong-Ihl, JOURNAL OF PHYSICAL CHEMISTRY B, v.109, no.2, pp.968 - 972, 2005-01

5
Crystal structure and spontaneous polarization of Bi4-xNdxTi3O12 studied by using neutron powder diffraction data

Jeon, Min-Ku; Kim, Yong-Il; Nahm, Seung-Hoon; Sohn, Jung-Min; Jung, Chang-Hwa; Woo, Seong-Ihl, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.40, no.15, pp.4647 - 4652, 2007-08

6
Electrical properties of (Bi3.5La0.5)Ti3O12 thin-films prepared by liquid source misted chemical deposition

Chung, HJ; Chung, SJ; Jeon, MK; Woo, Seong-Ihl, KOREAN JOURNAL OF CHEMICAL ENGINEERING, v.23, pp.329 - 332, 2006-03

7
Ferroelectric properties of Bi(4-x)Ce(x)Ti(3)O(12) (0 < x < 4) thin film array fabricated from Bi(2)O(3)/CeO(2)/TiO(2) multilayers using multitarget sputtering

Kim, Ki-Woong; Kim, Tai-Suk; Jeon, Min-Ku; Oh, Kwang-Seok; Jung, Chang-Hwa; Woo, Seong-Ihl, APPLIED PHYSICS LETTERS, v.92, no.5, 2008-02

8
Ferroelectric properties of Bi3.25Ce0.75Ti3O12 thin films prepared by a liquid source misted chemical deposition

Jeon, MK; Chung, HJ; Kim, KW; Oh, KS; Woo, Seong-Ihl, THIN SOLID FILMS, v.489, no.1-2, pp.1 - 4, 2005-10

9
High-throughput screening of ferroelectric materials for non-volatile random access memory using multilayer perceptrons

Kang, Sookil; Park, Sohee; Kim, Ki Woong; Woo, Seong-Ihl; Park, Sunwon, APPLIED SURFACE SCIENCE, v.254, no.3, pp.725 - 733, 2007-11

10
Phase transition in ABi(4)Ti(4)O(15) (A=Ca,Sr,Ba) Aurivillius oxides prepared through a soft chemical route

Rout, S. K.; Sinha, E.; Hussian, A.; Lee, J. S.; Ahn, C. W.; Kim, I. W.; Woo, Seong-Ihl, JOURNAL OF APPLIED PHYSICS, v.105, no.2, 2009-01

11
Quantitative structure-property relationship in a combinatorial Bi4-xLaxTi3O12 (0 <= x <= 1) thin film array obtained with microbeam XRD and Raman Spectroscopy

Kim, Ki Woong; Jeon, Min Ku; Kim, Tai Suk; Oh, Kwang Seok; Shin, Joong-Won; Woo, Seong-Ihl, JOURNAL OF COMBINATORIAL CHEMISTRY, v.9, no.5, pp.823 - 827, 2007

12
Structure analysis of ferroelectric Bi4Ti3O12 by using X-ray powder diffraction

Jeon, MK; Woo, Seong-Ihl; Kim, YI; Nahm, SH, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.45, no.5, pp.1240 - 1243, 2004-11

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