Influence of Oxygen Contamination on Annealing Behaviours of Spin Density and Optical Gap of Amorphous Silicon Films
- Publisher
- Pergamon-Elsevier Science Ltd
- Issue Date
- 1982-04
- Language
- English
- Article Type
- Article
- Citation
SOLID STATE COMMUNICATIONS, v.42, no.1, pp.71 - 74
- ISSN
- 0038-1098
- Appears in Collection
- Files in This Item
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