A High-Resolution Transmission Electron Microscopy Study of Defects in (001) CdTe/(001) GaAs
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | M.S. Kwon | ko |
| dc.contributor.author | J.Y Lee | ko |
| dc.contributor.author | W.J. Sohng | ko |
| dc.contributor.author | S.-H. Suh | ko |
| dc.date.accessioned | 2013-02-25T03:44:20Z | - |
| dc.date.available | 2013-02-25T03:44:20Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1994-12 | - |
| dc.identifier.citation | KOREAN APPLIED PHYSICS, v.7, no.4, pp.266 - 271 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/59593 | - |
| dc.language | Korean | - |
| dc.publisher | 한국물리학회 | - |
| dc.title | A High-Resolution Transmission Electron Microscopy Study of Defects in (001) CdTe/(001) GaAs | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 7 | - |
| dc.citation.issue | 4 | - |
| dc.citation.beginningpage | 266 | - |
| dc.citation.endingpage | 271 | - |
| dc.citation.publicationname | KOREAN APPLIED PHYSICS | - |
| dc.contributor.localauthor | J.Y Lee | - |
| dc.contributor.nonIdAuthor | M.S. Kwon | - |
| dc.contributor.nonIdAuthor | W.J. Sohng | - |
| dc.contributor.nonIdAuthor | S.-H. Suh | - |
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