DC Field | Value | Language |
---|---|---|
dc.contributor.author | SON, JH | ko |
dc.contributor.author | Kim, Joungho | ko |
dc.contributor.author | MOUROU, GA | ko |
dc.date.accessioned | 2013-02-25T03:17:43Z | - |
dc.date.available | 2013-02-25T03:17:43Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1994-06 | - |
dc.identifier.citation | IEEE MICROWAVE AND GUIDED WAVE LETTERS, v.4, no.6, pp.186 - 188 | - |
dc.identifier.issn | 1051-8207 | - |
dc.identifier.uri | http://hdl.handle.net/10203/59409 | - |
dc.description.abstract | Measurement of picosecond electrical signals using a photoconductive step-function gate is demonstrated analytically and experimentally. The time resolution of our step-function technique is limited only by the rise time of the step-function, which is approximately the same as the laser pulse width. Also, a regular, unhoped semiconductor material, which is essential for the realization of a short-duration gate, can be used instead of the highly defected material. The use of unhoped material gives 10 to 100 times higher sensitivity in the measurement than the impulse-function technique because of the high mobility of the unhoped material. | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | PHOTOCONDUCTIVE STEP-FUNCTION SAMPLING | - |
dc.type | Article | - |
dc.identifier.wosid | A1994NW04800011 | - |
dc.identifier.scopusid | 2-s2.0-0028442383 | - |
dc.type.rims | ART | - |
dc.citation.volume | 4 | - |
dc.citation.issue | 6 | - |
dc.citation.beginningpage | 186 | - |
dc.citation.endingpage | 188 | - |
dc.citation.publicationname | IEEE MICROWAVE AND GUIDED WAVE LETTERS | - |
dc.contributor.localauthor | Kim, Joungho | - |
dc.contributor.nonIdAuthor | SON, JH | - |
dc.contributor.nonIdAuthor | MOUROU, GA | - |
dc.type.journalArticle | Article | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.