DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lim, Ho Bin | ko |
dc.contributor.author | BUBE, RH | ko |
dc.date.accessioned | 2013-02-25T03:08:31Z | - |
dc.date.available | 2013-02-25T03:08:31Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1968 | - |
dc.identifier.citation | JOURNAL OF APPLIED PHYSICS, v.39, no.6, pp.2908 - 2914 | - |
dc.identifier.issn | 0021-8979 | - |
dc.identifier.uri | http://hdl.handle.net/10203/59355 | - |
dc.language | English | - |
dc.publisher | AMER INST PHYSICS | - |
dc.title | PHOTOELECTRONIC EVALUATION OF ELECTRON RADIATION DAMAGE IN CDS CRYSTALS | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.citation.volume | 39 | - |
dc.citation.issue | 6 | - |
dc.citation.beginningpage | 2908 | - |
dc.citation.endingpage | 2914 | - |
dc.citation.publicationname | JOURNAL OF APPLIED PHYSICS | - |
dc.contributor.localauthor | Lim, Ho Bin | - |
dc.contributor.nonIdAuthor | BUBE, RH | - |
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