COMPOSITIONAL ANALYSIS OF LEAD TITANATE THIN-FILMS BY AUGER-ELECTRON SPECTROSCOPY AND THEIR ELECTRICAL-PROPERTIES
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | YOON, SG | ko |
| dc.contributor.author | LEE, HY | ko |
| dc.contributor.author | Kim, Ho Gi | ko |
| dc.date.accessioned | 2013-02-25T01:47:37Z | - |
| dc.date.available | 2013-02-25T01:47:37Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1989-04 | - |
| dc.identifier.citation | THIN SOLID FILMS, v.171, no.2, pp.251 - 262 | - |
| dc.identifier.issn | 0040-6090 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/58888 | - |
| dc.language | English | - |
| dc.publisher | ELSEVIER SCIENCE SA LAUSANNE | - |
| dc.title | COMPOSITIONAL ANALYSIS OF LEAD TITANATE THIN-FILMS BY AUGER-ELECTRON SPECTROSCOPY AND THEIR ELECTRICAL-PROPERTIES | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1989U638500002 | - |
| dc.identifier.scopusid | 2-s2.0-0024640974 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 171 | - |
| dc.citation.issue | 2 | - |
| dc.citation.beginningpage | 251 | - |
| dc.citation.endingpage | 262 | - |
| dc.citation.publicationname | THIN SOLID FILMS | - |
| dc.identifier.doi | 10.1016/0040-6090(89)90632-9 | - |
| dc.contributor.localauthor | Kim, Ho Gi | - |
| dc.contributor.nonIdAuthor | YOON, SG | - |
| dc.contributor.nonIdAuthor | LEE, HY | - |
| dc.type.journalArticle | Article | - |
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