Simple technique for measuring the injection current induced frequency deviation of semiconductor lasers
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Chung, Yun Chur | ko |
| dc.contributor.author | Shay, TM | ko |
| dc.date.accessioned | 2013-02-25T00:13:42Z | - |
| dc.date.available | 2013-02-25T00:13:42Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1989-02 | - |
| dc.identifier.citation | APPLIED OPTICS, v.28, no.4, pp.648 - 649 | - |
| dc.identifier.issn | 0003-6935 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/58317 | - |
| dc.language | English | - |
| dc.publisher | Optical Soc Amer | - |
| dc.title | Simple technique for measuring the injection current induced frequency deviation of semiconductor lasers | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1989T445800001 | - |
| dc.identifier.scopusid | 2-s2.0-84975575101 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 28 | - |
| dc.citation.issue | 4 | - |
| dc.citation.beginningpage | 648 | - |
| dc.citation.endingpage | 649 | - |
| dc.citation.publicationname | APPLIED OPTICS | - |
| dc.contributor.localauthor | Chung, Yun Chur | - |
| dc.contributor.nonIdAuthor | Shay, TM | - |
| dc.description.isOpenAccess | N | - |
| dc.type.journalArticle | Letter | - |
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