DC Field | Value | Language |
---|---|---|
dc.contributor.author | YANG, YY | ko |
dc.contributor.author | Kyung, Chong-Min | ko |
dc.date.accessioned | 2013-02-24T14:44:24Z | - |
dc.date.available | 2013-02-24T14:44:24Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1985 | - |
dc.identifier.citation | IEEE TRANSACTIONS ON ELECTRON DEVICES, v.32, no.9, pp.1887 - 1889 | - |
dc.identifier.issn | 0018-9383 | - |
dc.identifier.uri | http://hdl.handle.net/10203/57961 | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | A SEMI-2-DIMENSIONAL NUMERICAL SCHEME FOR SOLVING IMPURITY PROFILE IN SEMICONDUCTORS | - |
dc.type | Article | - |
dc.identifier.wosid | A1985ARZ8600043 | - |
dc.identifier.scopusid | 2-s2.0-0022120353 | - |
dc.type.rims | ART | - |
dc.citation.volume | 32 | - |
dc.citation.issue | 9 | - |
dc.citation.beginningpage | 1887 | - |
dc.citation.endingpage | 1889 | - |
dc.citation.publicationname | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
dc.contributor.localauthor | Kyung, Chong-Min | - |
dc.contributor.nonIdAuthor | YANG, YY | - |
dc.type.journalArticle | Note | - |
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