DC Field | Value | Language |
---|---|---|
dc.contributor.author | H.C.Oh | ko |
dc.contributor.author | Kyung, Chong-Min | ko |
dc.date.accessioned | 2013-02-24T10:45:04Z | - |
dc.date.available | 2013-02-24T10:45:04Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1984-11 | - |
dc.identifier.citation | 전기학회논문지, v.21, no.6, pp.17 - 26 | - |
dc.identifier.issn | 1975-8359 | - |
dc.identifier.uri | http://hdl.handle.net/10203/56568 | - |
dc.language | Korean | - |
dc.publisher | 대한전기학회 | - |
dc.title | Numerical Evaluation of Impurity Profile in Silicon | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.citation.volume | 21 | - |
dc.citation.issue | 6 | - |
dc.citation.beginningpage | 17 | - |
dc.citation.endingpage | 26 | - |
dc.citation.publicationname | 전기학회논문지 | - |
dc.contributor.localauthor | Kyung, Chong-Min | - |
dc.contributor.nonIdAuthor | H.C.Oh | - |
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