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A formal approach to the study of the evolution and commonality of patterns Lee, Ji-Hyun; Park, Hyoung-June; Lim, Sungwoo; Kim, Sun-Joong, ENVIRONMENT AND PLANNING B-PLANNING & DESIGN, v.40, no.1, pp.23 - 42, 2013-02 |
High-Quality Depth Estimation Using an Exemplar 3D Model for Stereo Conversion Lee, Jungjin; Kim, Younghui; Lee, Sangwoo; Kim, Bumki; Noh, J, IEEE TRANSACTIONS ON VISUALIZATION AND COMPUTER GRAPHICS, v.21, no.7, pp.835 - 847, 2015-07 |
Partial Sum Minimization of Singular Values in Robust PCA: Algorithm and Applications Oh, Tae-Hyun; Tai, Yu-Wing; Bazin, Jean-Charles; Kim, Hyeongwoo; Kweon, In So, IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, v.38, no.4, pp.744 - 758, 2016-04 |
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