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Comparative study of the ToF-SIMS, FT-IR and XPS techniques for quantitative analyses of mixed self-assembled monolayers

Son, Jin Gyeong; Shon, Hyun Kyong; Choi, Changrok; Han, Sang Woo; Lee, Tae Geol, SURFACE AND INTERFACE ANALYSIS, v.46, pp.110 - 114, 2014-11

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