Showing results 1 to 2 of 2
Effects of interface bonding and defects on boron diffusion at Si/SiO2 interface Kim, Geun-Myeong; Oh, Young Jun; Chang, Kee-Joo, JOURNAL OF APPLIED PHYSICS, v.114, no.22, pp.223705 - 223705, 2013-12 |
Suppression of boron segregation by interface Ge atoms at SiGe/SiO2 interface Lee, Chang Hwi; Kim, Geun Myeong; Oh, Young Jun; Chang, Kee-Joo, CURRENT APPLIED PHYSICS, v.14, no.11, pp.1557 - 1563, 2014-11 |
Discover