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Ab initio study of boron segregation and deactivation at Si/SiO2 interface Oh, Young-Jun; Hwang, Jin-Heui; Noh, Hyeon-Kyun; Bang, Jun-Hyeok; Ryu, Byung-Ki; Chang, Kee-Joo, MICROELECTRONIC ENGINEERING, v.89, pp.120 - 123, 2012-01 |
First-principles study on the defect properties of Si and ZnO and the transport behavior of hydrogenated graphene = 실리콘 및 산화아연 반도체에서의 결함 특성과 수소화된 그라핀의 전기전도 특성에 대한 제일원리 연구link Bang, Jun-Hyeok; 방준혁; et al, 한국과학기술원, 2010 |
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