Atomic force microscope 를 이용한 $Ge_2Sb_2Te_5$ 박막의 상변화 거동 및 전기적 특성평가The estimation of the phase change behavior and electrical property of $Ge_2Sb_2Te_5$ thin films using atomic force microscope
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 최시경 | - |
| dc.contributor.advisor | Choi, Si-Kyung | - |
| dc.contributor.author | 노기민 | - |
| dc.contributor.author | Roh, Ki-Min | - |
| dc.date.accessioned | 2011-12-15T01:47:35Z | - |
| dc.date.available | 2011-12-15T01:47:35Z | - |
| dc.date.issued | 2005 | - |
| dc.identifier.uri | http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=249539&flag=dissertation | - |
| dc.identifier.uri | http://hdl.handle.net/10203/51677 | - |
| dc.description | 학위논문(석사) - 한국과학기술원 : 신소재공학과, 2005, [ vii, 50 p. ] | - |
| dc.language | kor | - |
| dc.publisher | 한국과학기술원 | - |
| dc.subject | 상변화 메모리 | - |
| dc.subject | 정보저장 장치 | - |
| dc.subject | 원자현미경 | - |
| dc.subject | Atomic force microscope(AFM) | - |
| dc.subject | PRAM | - |
| dc.subject | phase change memory | - |
| dc.subject | data storage | - |
| dc.title | Atomic force microscope 를 이용한 $Ge_2Sb_2Te_5$ 박막의 상변화 거동 및 전기적 특성평가 | - |
| dc.title.alternative | The estimation of the phase change behavior and electrical property of $Ge_2Sb_2Te_5$ thin films using atomic force microscope | - |
| dc.type | Thesis(Master) | - |
| dc.identifier.CNRN | 249539/325007 | - |
| dc.description.department | 한국과학기술원 : 신소재공학과, | - |
| dc.identifier.uid | 020043187 | - |
| dc.contributor.localauthor | 최시경 | - |
| dc.contributor.localauthor | Choi, Si-Kyung | - |
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