Atomic force microscope를 이용한 탐침 정보 저장용 PZT 박막의 조성에 따른 도메인 특성 분석Domain characterization of PZT thin films using atomic force microscope for probe based data storage
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 노광수 | - |
| dc.contributor.advisor | 배병수 | - |
| dc.contributor.advisor | No, Kwang-Soo | - |
| dc.contributor.advisor | Bae, Byeong-Soo | - |
| dc.contributor.author | 김윤석 | - |
| dc.contributor.author | Kim, Yun-Seok | - |
| dc.date.accessioned | 2011-12-15T01:46:17Z | - |
| dc.date.available | 2011-12-15T01:46:17Z | - |
| dc.date.issued | 2004 | - |
| dc.identifier.uri | http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=238314&flag=dissertation | - |
| dc.identifier.uri | http://hdl.handle.net/10203/51600 | - |
| dc.description | 학위논문(석사) - 한국과학기술원 : 신소재공학과, 2004.2, [ ix, 69 p. ] | - |
| dc.language | kor | - |
| dc.publisher | 한국과학기술원 | - |
| dc.subject | PZT | - |
| dc.subject | 조성 | - |
| dc.subject | 도메인 | - |
| dc.subject | PROBE BASED DATA STORAGE | - |
| dc.subject | ATOMIC FORCE MICROSCOPE | - |
| dc.subject | PZT | - |
| dc.subject | COMPOSITION | - |
| dc.subject | DOMAIN | - |
| dc.subject | 탐침 정보 저장 장치 | - |
| dc.subject | 원자력 현미경 | - |
| dc.title | Atomic force microscope를 이용한 탐침 정보 저장용 PZT 박막의 조성에 따른 도메인 특성 분석 | - |
| dc.title.alternative | Domain characterization of PZT thin films using atomic force microscope for probe based data storage | - |
| dc.type | Thesis(Master) | - |
| dc.identifier.CNRN | 238314/325007 | - |
| dc.description.department | 한국과학기술원 : 신소재공학과, | - |
| dc.identifier.uid | 020023125 | - |
| dc.contributor.localauthor | 김윤석 | - |
| dc.contributor.localauthor | Kim, Yun-Seok | - |
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