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Results 1-1 of 1 (Search time: 0.003 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
(A) Study on the Reliability of VLSI Nano-Interconnections = VLSI 나노배선의 신뢰성에 관한 연구link

Lee, Min-Hyung; 이민형; Paik, Kyung-Wook; 백경욱, 한국과학기술원, 2010

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