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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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(A) Study on the Reliability of VLSI Nano-Interconnections = VLSI 나노배선의 신뢰성에 관한 연구link Lee, Min-Hyung; 이민형; Paik, Kyung-Wook; 백경욱, 한국과학기술원, 2010 |
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