Browse "NT-Conference Papers(학술회의논문) " by Author Cho, Sanghee
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| Detecting defects with thermoelectricity at the atomic scale Lee, Eui-Sup; Kim, Yong-Hyun; Yeo, Hogi; Cho, Sanghee, International Conference on Physics and Semiconductors (ICPS 2014), The University of TEXAS at Austin, 2014-08-12 |
| Scanning Thermoelectric Microscopywith Atomic Resolution: SeebeckEffect at the Atomic Scale Kim, Yong-Hyun; Lee, Eui Sup; Cho, Sanghee; Kang, Stephen Dongmin; Kim, Wondong; Woo,Sung-Jae; Kong, Ki-Jeong; et al, 제 10회 표면나노과학 워크샵, 원자제어 저차원 전자계 연구단, 2014-02-07 |
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- 601 2010 - 2019
- 67 2000 - 2009
- 9 1991 - 1999