DSpace at KOASAS: 다결정 실리콘 박막 트랜지스터에서의 바이어스에 의한 결함 생성에 관한 연구

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College of Natural Sciences(자연과학대학)Dept. of Physics(물리학과)PH-Theses_Ph.D.(박사논문)

다결정 실리콘 박막 트랜지스터에서의 바이어스에 의한 결함 생성에 관한 연구Bias stress induced defects in polycrystalline silicon thin film transistor

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김서윤 / Kim, Seo-Yoon

Advisors: 신성철 researcher; 이주천 researcher; Shin, Sung-Chul researcher; Lee, Choo-Choon researcher

Description: 한국과학기술원 : 물리학과,

Publisher: 한국과학기술원

Issue Date: 1996

Identifier: 108882/325007 / 000895065

Language: kor

Description: 학위논문(박사) - 한국과학기술원 : 물리학과, 1996.8, [ vii, 92 p. ]

Keywords: 다결정 실리콘; 박막 트랜지스터; Activation energy; Grain boundary; Simulation; Thin film transistor; Poly-Si; 활성화 에너지; 모델링

URI: http://hdl.handle.net/10203/47538

Link: http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=108882&flag=dissertation

Appears in Collection: PH-Theses_Ph.D.(박사논문)

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다결정 실리콘 박막 트랜지스터에서의 바이어스에 의한 결함 생성에 관한 연구Bias stress induced defects in polycrystalline silicon thin film transistor

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