METASTABILITY OF CMOS LATCH FLIP-FLOP
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Lee-Sup | ko |
| dc.contributor.author | DUTTON, RW | ko |
| dc.date.accessioned | 2007-06-07T01:07:52Z | - |
| dc.date.available | 2007-06-07T01:07:52Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1990-08 | - |
| dc.identifier.citation | IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.25, no.4, pp.942 - 951 | - |
| dc.identifier.issn | 0018-9200 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/471 | - |
| dc.description | JSSC 1990 | en |
| dc.description.sponsorship | The authors wish to thank Signetics for fabricating the test circuits. The authors also thank R. Cline of Signetics for helping with the measurements. | en |
| dc.language | English | - |
| dc.language.iso | en_US | en |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
| dc.title | METASTABILITY OF CMOS LATCH FLIP-FLOP | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1990DQ56300005 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 25 | - |
| dc.citation.issue | 4 | - |
| dc.citation.beginningpage | 942 | - |
| dc.citation.endingpage | 951 | - |
| dc.citation.publicationname | IEEE JOURNAL OF SOLID-STATE CIRCUITS | - |
| dc.identifier.doi | 10.1109/4.58286 | - |
| dc.embargo.liftdate | 9999-12-31 | - |
| dc.embargo.terms | 9999-12-31 | - |
| dc.contributor.localauthor | Kim, Lee-Sup | - |
| dc.contributor.nonIdAuthor | DUTTON, RW | - |
| dc.type.journalArticle | Article | - |
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