고배율 현미경 비젼 시스템을 이용한 길이측정에서의 에지검출 및 보정Edge detection and calibration of high magnification optical microscope vision systems for coordinate metrology
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 김승우 | - |
| dc.contributor.advisor | Kim, Seung-Woo | - |
| dc.contributor.author | 박민철 | - |
| dc.contributor.author | Park, Min-Cheol | - |
| dc.date.accessioned | 2011-12-14T06:57:41Z | - |
| dc.date.available | 2011-12-14T06:57:41Z | - |
| dc.date.issued | 1996 | - |
| dc.identifier.uri | http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=105418&flag=dissertation | - |
| dc.identifier.uri | http://hdl.handle.net/10203/46519 | - |
| dc.description | 학위논문(석사) - 한국과학기술원 : 기계공학과, 1996.2, [ v, 51 p. ] | - |
| dc.language | kor | - |
| dc.publisher | 한국과학기술원 | - |
| dc.subject | 가간섭성 | - |
| dc.subject | 에지검출 | - |
| dc.subject | 초점위치오차 | - |
| dc.subject | Defocus | - |
| dc.subject | Coherence | - |
| dc.subject | Edge detection | - |
| dc.title | 고배율 현미경 비젼 시스템을 이용한 길이측정에서의 에지검출 및 보정 | - |
| dc.title.alternative | Edge detection and calibration of high magnification optical microscope vision systems for coordinate metrology | - |
| dc.type | Thesis(Master) | - |
| dc.identifier.CNRN | 105418/325007 | - |
| dc.description.department | 한국과학기술원 : 기계공학과, | - |
| dc.identifier.uid | 000943192 | - |
| dc.contributor.localauthor | 김승우 | - |
| dc.contributor.localauthor | Kim, Seung-Woo | - |
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- ME-Theses_Master(석사논문)
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