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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Leveraging Contextual Information for Monocular Depth Estimation![]() Kim, Doyeon; Lee, Sihaeng; Lee, Janghyeon; Kim, Junmo, IEEE ACCESS, v.8, pp.147808 - 147817, 2020-08 | |
D3PointNet: Dual-Level Defect Detection PointNet for Solder Paste Printer in Surface Mount Technology![]() Park, Jin-Man; Yoo, Yong-Ho; Kim, Ue-Hwan; Lee, Dukyoung; Kim, Jong-Hwan, IEEE ACCESS, v.8, pp.140310 - 140322, 2020-07 |
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