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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
Evolution of crystallographic structure and ferroelectricity of Hf0.5Zr0.5O2 films with different deposition rate Kim, Taeho; An, Minho; Jeon, Sanghun, AIP ADVANCES, v.10, no.1, 2020-01 |
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