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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Highly Manufacturable Device Isolation Technology Using Laser-Induced Epitaxial Growth for Monolithic Stack Devices Son, Yong-Hoon; Baik, Seung Jae; Jeon, Sanghun; Lee, Jong-Wook; Hwang, Gihyun; Shin, Yoo Gyun; Yoon, Euijoon, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.58, no.11, pp.3863 - 3868, 2011-11 | |
| Transparent Semiconducting Oxide Technology for Touch Free Interactive Flexible Displays Lee, Sungsik; Jeon, Sanghun; Chaji, Reza; Nathan, Arokia, PROCEEDINGS OF THE IEEE, v.103, no.4, pp.644 - 664, 2015-04 | |
| Oxygen Defect-Induced Metastability in Oxide Semiconductors Probed by Gate Pulse Spectroscopy Lee, Sungsik; Nathan, Arokia; Jeon, Sanghun; Robertson, John, SCIENTIFIC REPORTS, v.5, 2015-10 | |
| Photoresponse of an oxide semiconductor photosensor Ahn, Seung-Eon; Park, Sungho; Kim, Taeho; Park, Junghak; Jeon, Sanghun, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.33, no.3, 2015-05 | |
| High mobility and high stability glassy metal-oxynitride materials and devices Lee, Eunha; Kim, Taeho; Benayad, Anass; Hur, Jihyun; Park, Gyeong-Su; Jeon, Sanghun, SCIENTIFIC REPORTS, v.6, 2016-04 | |
| Pulse I-V characterization of a nanocrystalline oxide device with sub-gap density of states Kim, Taeho; Hur, Ji-Hyun; Jeon, Sanghun, NANOTECHNOLOGY, v.27, no.21, 2016-05 | |
| Three-Dimensional Integration Approach to High-Density Memory Devices Kim, Hojung; Jeon, Sanghun; Lee, Myoung-Jae; Park, Jaechul; Kang, Sangbeom; Choi, Hyun-Sik; Park, Churoo; Hwang, Hong-Sun; Kim, Changjung; Shin, Jaikwang; Chung, U-In, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.58, no.11, pp.3820 - 3828, 2011-11 | |
| Gated three-terminal device architecture to eliminate persistent photoconductivity in oxide semiconductor photosensor arrays Jeon, Sanghun; Ahn, Seung-Eon; Song, Ihun; Kim, Chang Jung; Chung, U-In; Lee, Eunha; Yoo, Inkyung; Nathan, Arokia; Lee, Sungsik; Robertson, John; Kim, Kinam, NATURE MATERIALS, v.11, no.4, pp.301 - 305, 2012-04 | |
| Microsecond Pulse I-V Approach to Understanding Defects in High Mobility Bi-layer Oxide Semiconductor Transistor Woo, Hyunsuk; Jeon, Sanghun, SCIENTIFIC REPORTS, v.7, 2017-08 | |
| Fast and slow transient charging of Oxide Semiconductor Transistors Kim, Taeho; Park, Sungho; Jeon, Sanghun, SCIENTIFIC REPORTS, v.7, 2017-09 |
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