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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Low-Frequency Noise Performance of a Bilayer InZnO-InGaZnO Thin-Film Transistor for Analog Device Applications Jeon, Sanghun; Kim, Sun Il; Park, Sungho; Song, Ihun; Park, Jaechul; Kim, Sangwook; Kim, Changjung, IEEE ELECTRON DEVICE LETTERS, v.31, no.10, pp.1128 - 1130, 2010-10 | |
| Fully transparent InGaZnO thin film transistors using indium tin oxide/graphene multilayer as source/drain electrodes Seo, David; Jeon, Sanghun; Seo, Sunae; Song, Ihun; Kim, Changjung; Park, Sungho; Harris, James S.; Chung, U. -In, APPLIED PHYSICS LETTERS, v.97, no.17, 2010-10 | |
| Metal Oxide Thin Film Phototransistor for Remote Touch Interactive Displays Ahn, Seung-Eon; Song, Ihun; Jeon, Sanghun; Jeon, Youg Woo; Kim, Young; Kim, Changjung; Ryu, Byungki; Lee, Je-Hun; Nathan, Arokia; Lee, Sungsik; Kim, Gyu Tae; Chung, U-In, ADVANCED MATERIALS, v.24, no.19, pp.2631 - 2636, 2012-05 | |
| Nanometer-Scale Oxide Thin Film Transistor with Potential for High-Density Image Sensor Applications Jeon, Sanghun; Park, Sungho; Song, Ihun; Hur, Ji-Hyun; Park, Jaechul; Kim, Hojung; Kim, Sunil; Kim, Sangwook; Yin, Huaxiang; Chung, U-In; Lee, Eunha; Kim, Changjung, ACS APPLIED MATERIALS & INTERFACES, v.3, no.1, pp.1 - 6, 2011-01 | |
| The influence of visible light on the gate bias instability of In-Ga-Zn-O thin film transistors Kim, Sangwook; Kim, Sunil; Kim, Changjung; Park, JaeChul; Song, Ihun; Jeon, Sanghun; Ahn, Seung-Eon; Park, Jin-Seong; Jeong, Jae Kyeong, SOLID-STATE ELECTRONICS, v.62, no.1, pp.77 - 81, 2011-08 | |
| Short channel device performance of amorphous InGaZnO thin film transistor Jeon, Sanghun; Benayad, Anass; Ahn, Seung-Eon; Park, Sungho; Song, Ihun; Kim, Changjung; Chung, U-In, APPLIED PHYSICS LETTERS, v.99, no.8, 2011-08 | |
| High-Performance Nanowire Oxide Photo-Thin Film Transistors Ahn, Seung-Eon; Jeon, Sanghun; Jeon, Youg Woo; Kim, Changjung; Lee, Myoung-Jae; Lee, Chang-Won; Park, Jongbong; Song, Ihun; Nathan, Arokia; Lee, Sungsik; Chung, U-In, ADVANCED MATERIALS, v.25, no.39, pp.5549 - 5554, 2013-10 |
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