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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Low-Frequency Noise Characteristics in SONOS Flash Memory With Vertically Stacked Nanowire FETs Bang, Te-Wook; Lee, Byung-Hyun; Kim, Choong-Ki; Ahn, Dae-Chul; Jeon, Seung-Bae; Kang, Min-Ho; Oh, Jae-Sub; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.38, no.1, pp.40 - 43, 2017-01 | |
| Through Silicon Via (TSV) Defect Modeling, Measurement, and Analysis Jung, Daniel Hyunsuk; Kim, Youngwoo; Kim, Jonghoon J.; Kim, Heegon; Choi, Sumin; Song, Yoon-Ho; Bae, Hyun-Cheol; Choi, Kwang-Seong; Piersanti, Stefano; de Paulis, Francesco; Orlandi, Antonio; Kim, Joungho, IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, v.7, no.1, pp.138 - 152, 2017-01 | |
| Seed growing for interactive image segmentation using SVM classification with geodesic distance Park, Sun Jeong; Lee, Han Sang; Kim, Junmo, ELECTRONICS LETTERS, v.53, no.1, pp.22 - 23, 2017-01 | |
| Fabrication of Vertical Silicon Nanotube Array Using Spacer Patterning Technique and Metal-Assisted Chemical Etching Jeong, Hyeon Ho; Lee, Junghyung; Bok, Cheolkyu; Lee, Seok-Hee; Yoo, Seunghyup, IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.16, no.1, pp.130 - 134, 2017-01 | |
| Coupling-Shielded Inductor for High Isolation Between PA and LC-Based DCO Yoo, Sang-Sun; Lee, Kang-Yoon; Yoo, Hyung-Joun, IEEE ELECTRON DEVICE LETTERS, v.38, no.1, pp.24 - 27, 2017-01 | |
| Functional Circuitry on Commercial Fabric via Textile-Compatible Nanoscale Film Coating Process for Fibertronics Bae, Hagyoul; Jang, Byung Chul; Park, Hongkeun; Jung, Soo-Ho; Lee, Hye Moon; Park, Jun-Young; Jeon, Seung-Bae; Son, Gyeongho; Tcho, Il-Woong; Yu, Kyoungsik; Im, Sung Gap; Choi, Sung-Yool; Choi, Yang-Kyu, NANO LETTERS, v.10, no.10, pp.6443 - 6452, 2017-10 | |
| Paper-Based Bimodal Sensor for Electronic Skin Applications Jung, Minhyun; Kim, Kyungkwan; Kim, Bumjin; Cheong, Haena; Shin, Kwanwoo; Kwon, Oh-Sun; Park, Jong-Jin; Jeon, Sanghun, ACS APPLIED MATERIALS & INTERFACES, v.9, no.32, pp.26974 - 26982, 2017-08 | |
| Fast and slow transient charging of Oxide Semiconductor Transistors Kim, Taeho; Park, Sungho; Jeon, Sanghun, SCIENTIFIC REPORTS, v.7, 2017-09 | |
| Sub-60-mV / decade Negative Capacitance FinFET With Sub-10-nm Hafnium-Based Ferroelectric Capacitor Ko, Eunah; Lee, Hyunjae; Goh, Youngin; Jeon, Sanghun; Shin, Changhwan, IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, v.5, no.5, pp.306 - 309, 2017-09 | |
| Impact of fast transient charging and ambient on mobility of WS2 field-effect transistor Park, Junghak; Woo, Hyunsuk; Jeon, Sanghun, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.35, no.5, 2017-09 |
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