1 | Enhancement of resistive switching properties in Al2O3 bilayer-based atomic switches: multilevel resistive switching Vishwanath, Sujaya Kumar; Woo, Hyunsuk; Jeon, Sanghun, NANOTECHNOLOGY, v.29, no.23, 2018-06 |
2 | Discharge Current Analysis Estimating the Defect Sites in Amorphous Hafnia Thin-Film Transistor Goh, Youngin; Jeon, Sanghun, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.8, pp.3264 - 3268, 2018-08 |
3 | Effect of dysprosium and lutetium metal buffer layers on the resistive switching characteristics of Cu-Sn alloy-based conductive-bridge random access memory Vishwanath, Sujaya Kumar; Woo, Hyunsuk; Jeon, Sanghun, NANOTECHNOLOGY, v.29, no.38, 2018-09 |
4 | First-order reversal curve diagrams for characterizing ferroelectricity of Hf0.5Zr0.5O2 films grown at different rates Goh, Youngin; Jeon, Sanghun, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.36, no.5, 2018-09 |
5 | Quantitative analysis of charge trapping and classification of sub-gap states in MoS2 TFT by pulse I-V method Park, Junghak; Hur, Ji-Hyun; Jeon, Sanghun, NANOTECHNOLOGY, v.29, no.17, 2018-04 |
6 | Enhanced tunneling electroresistance effects in HfZrO-based ferroelectric tunnel junctions by high-pressure nitrogen annealing Goh, Youngin; Jeon, Sanghun, APPLIED PHYSICS LETTERS, v.113, no.5, 2018-07 |
7 | Scalable and facile synthesis of stretchable thermoelectric fabric for wearable self-powered temperature sensors Jung, Minhyun; Jeon, Sanghun; Bae, Jihyun, RSC ADVANCES, v.8, no.70, pp.39992 - 39999, 2018-12 |
8 | The effect of the bottom electrode on ferroelectric tunnel junctions based on CMOS-compatible HfO2 Goh, Youngin; Jeon, Sanghun, NANOTECHNOLOGY, v.29, no.33, 2018-08 |
9 | Non-volatile resistive switching in CuBi-based conductive bridge random access memory device Vishwanath, Sujaya Kumar; Woo, Hyunsuk; Jeon, Sanghun, APPLIED PHYSICS LETTERS, v.112, no.25, 2018-06 |
10 | Resistive switching characteristics of a modified active electrode and Ti buffer layer in Cu-Se-based atomic switch Woo, Hyunsuk; Vishwanath, Sujaya Kumar; Jeon, Sanghun, JOURNAL OF ALLOYS AND COMPOUNDS, v.753, pp.551 - 557, 2018-07 |